The SMS 2021/ EGF 2021/ Sensors 2021/ NanoMed 2021 joint conferences committee includes:
- Prof. Vasco Teixeira, University of Minho, Portugal
- Prof. Massimo De Vittorio, Italian Institute of Technology, Italy
- Prof. Georgios Priniotakis, Piraeus University of Applied Science, Greece
- Prof. Lim Chwee Teck, National University of Singapore, Singapore
- Prof. J.T.M. de Hosson, University of Groningen, The Netherlands
- Dr. Raul Arenal, Zaragoza University, Spain
- Prof. Ahmed Elmarakbi, Northumbria University, UK
- Prof. Luis Miguel Varela, University of Santiago de Compostela, Spain
- Dr. Lucia Gemma Delogu, University of Sassari, Italy
- Prof. Alexander M. Seifalian, The London BioScience Innovation Centre, UK
- Dr. Anne Schwarz-Pfeiffer, University Hochschule Niederrhein, Germany
- Dr. Núria Crivillers, de Barcelona.Autònoma University, Spain
- Prof. Raafat El-Hacha, The University of Calgary, Canada
- Prof. Damjana Drobne, University of Ljubljana, Slovenia
- Prof. Yurii K. Gun'ko, Trinity College Dublin, Ireland
- Prof. Valentina Cauda, Polytechnic University of Turin, Italy
- Prof. Francesca Granucci, University of Milano-Bicocca, Italy
- Prof. Konstantinos Avgoustakis, Department of Pharmacy, University of Patras, Greece
- Dr. Anne Schwarz-Pfeiffer, University Hochschule Niederrhein, Germany
- Dr. Blerina Kolgjini, Polytechnic University of Tiran, Albania
- Mr. Volker Lutz, RWTH Aachen University, Germany
- Prof. Rita Rizzoli, CNR Institute for Microelectronics and Microsystems- Bologna, Italy
- Prof. Rahul R.Nair, Manchester University, UK
- Prof. Gianaurelio Cuniberti, Dresden University of Technology, Germany
- Prof. Georgios Priniotakis, Piraeus University of Applied Science, Greece
- Prof. Nirmala Grace, Centre for Nanotechnology Research, India
- Prof. Alina Pruna, ITM-UPV, Spain
- Prof. Nuno Miguel Machado Reis Peres,University of Minho, Portugal
- Dr. Takoua Ben Issa, SETCOR, France
- Prof. Ho Won Jang, Seoul National University, Rep. of Korea
- Dr. Camilla Baratto, Università di Brescia, Italy
- Prof. Huamin Li, Department of Electrical Engineering, University at Buffalo, USA