The NanoMetrology 2022 conference topics/ sessions include, but not limited to:
Characterization at the nanoscale
- State of the art of measurement at the nanoscale level
- Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)
- Nanotribology, Surface nanometrology/ 3D printing, etc
- Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings)
- New and emerging measurement and analysis technologies, and recent advances in standards and regulatory frameworks
- Presentation of innovative studies reporting new results in the characterization of nanomaterials and nano-systems
Standards for nanometer scale Characterization
- Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)
- Divulgation of good laboratory practice, Traceability, uncertainty, calibration, verification, etc
- Precision instrumentation design and theory; optical instruments; scanning probe microscopies; particle beam microscopy; surface topography measurement; and aspects of in-line measurement
Modeling and simulations at the nanoscale
- New developments in modeling and simulations at the nanoscale
- Emerging control theory and applications
Nanosafety/ Nanotoxicity, Society and regulation issues
- NanoToxicology
- Sustainable nanomanufacturing
- Risk assessment and management
- Measurement of health risk/ Exposure scenarios
- Regulation and ethical impacts/ Scientific Policy
- Interface between development of new technology and global justice
