Prof. Jordi Arbiol graduated in Physics from the Universitat de Barcelona (UB) in 1997, he went on to obtain his PhD (European Doctorate and PhD Extraordinary Award) in 2001 from this same institution in the field of transmission electron microscopy (TEM) applied to nanostructured materials. He was assistant professor at the UB. From 2009 to 2015 he was ICREA Professor and group leader at the Institut de Ciència de Materials de Barcelona (ICMAB-CSIC). He was President of the Spanish Microscopy Society (SME) (2017-2021) and held the position of vice-president from 2013 to 2017, having been a member of its Executive Board (2009-2021). In 2018 he was elected as Member of the Executive Board of the International Federation of Societies for Microscopy (IFSM) (2019-2026).
Since 2015 he has been ICREA Professor and leader of the Advanced Electron Nanoscopy Group at the Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST. He is Scientific Supervisor of the Electron Microscopy Area at ICN2 and BIST, and also at the Electron Microscopy Center at the ALBA Synchrotron (EMCA). He has been one of the founding members of e-DREAM. He received the FWO Commemorative Medal (Flanders Research Foundation) in 2021, the BIST Ignite Award in 2018, the 2014 EU40 Materials Prize by the E-MRS, the 2014 EMS Outstanding Paper Award and was listed in the Top 40 under 40 Power List (2014) by The Analytical Scientist. As of May 2022 he has more than 415 peer-reviewed publications and more than 24700 citations (GoS) with h-index: 88 GoS (76 WoS).