The NanoMetrology 2019 conference topics include, but not limited to:
- Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)
- Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings
- Presentation of innovative studies reporting new results in the characterization of nanomaterials and nanosystems
- Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)
- Divulgation of good laboratory practice and traceability in nanoscale metrology
- Modeling and simulations at the nanoscale
- Society and regulation issues
