Metrology, from the Ancient Greek metron (measure) and logos (study of), is the science of measurement. Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Today's global economy depends on reliable measurements and tests, which are trusted and accepted internationally. This measurement infrastructure must be extended into the nanoscale and beyond, to bring nanotechnology based products or manufacturing processes successfully and safely into the market place.


The 5th edition of NanoMetrology 2019 event deals with the advancements in all the metrological aspects related to nanoscience and nanotechnology. It is open to all the areas connected to both theoretical and experimental aspects of metrology at the nanometer scale, from new methodologies for the quantitative characterization of nanomaterials, to new results in fields of characterization of nanomaterials and realization of nanometrological standards, which represent a key issue for making possible a successful technological transfer of nanotechnology. The aim of this event is to offer an opportunity to academicians, innovators and industrials to share, and divulge new methods, techniques and instrumentations, for metrology and characterization of nanomaterials, nanosystems, and nanodevices at the nanometer scale.


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Conference Chairs

Prof. James M. Hill

University of South Australia, Australia

Prof. Jacques Jupille

Université Pierre et Marie Curie (UPMC), CNRS Paris, France

Keynote Speakers

Prof. Ursel Bangert

University of Limerick, Ireland

Dr. Raul Arenal

University of Zaragoza, Spain

Prof. Nathalie Destouches

University of Saint-Etienne, France

Prof. Francesca Peiró

University of Barcelona, Spain

Prof. Paulo J Ferreira

International Iberian Nanotechnology Laboratory (INL), Portugal

Dr. Juan Antonio Zapien

City University of Hong Kong, Hong Kong

Prof. Ngamta Thamwattana

University of Newcastle, Australia

Invited Speakers

Prof. Myrtil Kahn

University of Toulouse , France