Nanometrology France 2017 Conference and Exhibition

Conference Topics

The NanoMetrology France 2017 topics include, but not limited to :


  • Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)
  • Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings
  • Presentation of innovative studies reporting new results in the characterization of nanomaterials and nanosystems
  • Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)
  • Divulgation of good laboratory practice and traceability in nanoscale metrology
  • Modeling and simulations for nanometrology
  • Society and regulation issues


In addition focused sessions/ symposia are organized by our partners including:


Focused session on NanoModelling

Chair: Prof. James M Hill, School of Mathematical Sciences, The University of Adelaide, Australia


Focused session on reliability of nanomaterials' size measurement


Dr. Goerges Favre, National Metrology and Testing Laboratory (LNE- Trappes), France

Dr Nicolas Feltin, National Metrology and Testing Laboratory (LNE- Trappes), France


Focused session on Electron microscopy in nanotechnology

Chair: Prof. Peter van Aken, Max Planck Institute for Solid State Research Heisenbergstr, Stuttgart-Germany


Focused session on Standards, Metrology and Quality Control of Carbon Materials

Chair: Dr. Pedro M. Da Costa, Physical Science and Engineering Division, KAUST- Saudi Arabia


Focused session on Nanosafety/Nanotoxicity

Chair: Prof Victor Puntes, ICN2 – Catalan Institute of Nanoscience and Nanotechnology – Spain