Nanometrology France 2017 International Conference & Exhibition

Nanometrology: is it the next big thing in measurement ?


Metrology, from the Ancient Greek metron (measure) and logos (study of), is the science of measurement. Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Today's global economy depends on reliable measurements and tests, which are trusted and accepted internationally. This measurement infrastructure must be extended into the nanoscale and beyond, to bring nanotechnology based products or manufacturing processes successfully and safely into the market place.


The NanoMetrology France event deals with the advancements in all the metrological aspects related to nanoscience and nanotechnology. It is open to all the areas connected to both theoretical and experimental aspects of metrology at the nanometer scale, from new methodologies for the quantitative characterization of nanomaterials, to new results in fields of characterization of nanomaterials and realization of nanometrological standards, which represent a key issue for making possible a successful technological transfer of nanotechnology. The aim of this event is to offer an opportunity to academicians, innovators and industrials to share, and divulge new methods, techniques and instrumentations, for metrology and characterization of nanomaterials, nanosystems, and nanodevices at the nanometer scale. The event topics include, but not limited to:


  • Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)

  • Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings

  • Presentation of innovative studies reporting new results in the characterization of nanomaterials and nanosystems

  • Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)

  • Divulgation of good laboratory practice and traceability in nanoscale metrology

  • Modeling and simulations for nanometrology

  • Society and regulation issues


In addition focused sessions/ symposia are organized by our partners including:


Focused session on NanoModelling

Chair: Prof. James M Hill, School of Mathematical Sciences, The University of Adelaide, Australia


Focused session on reliability of nanomaterials' size measurement


Dr. Goerges Favre, National Metrology and Testing Laboratory (LNE- Trappes), France

Dr Nicolas Feltin, National Metrology and Testing Laboratory (LNE- Trappes), France


Focused session on Electron microscopy in nanotechnology

Chair: Prof. Peter van Aken, Max Planck Institute for Solid State Research Heisenbergstr, Stuttgart-Germany


Focused session on Standards, Metrology and Quality Control of Carbon Materials

Chair: Dr. Pedro M. Da Costa, Physical Science and Engineering Division, KAUST- Saudi Arabia


Focused session on Nanosafety/Nanotoxicity

Chair: Prof Victor Puntes, ICN2 – Catalan Institute of Nanoscience and Nanotechnology – Spain


Please click here for the above topics details.



Conference Chairs

Dr. Georges Favre

Directeur de l’Institut LNE Nanotech, France

Prof. Jacques Jupille

Université Pierre et Marie Curie (UPMC), CNRS Paris, France

Keynote Speakers

Prof. James M. Hill

University of South Australia, Australia

Prof. Stuart Parkin

Max-Planck Institute, Germany

Prof. Jacques Jupille

Université Pierre et Marie Curie (UPMC), CNRS Paris, France


Media Partners